CHEMICAL STATE ANALYSIS OF Cr AND Fe BY IN-AIR PIXE USING A CURVED CRYSTAL SPECTROMETER COMBINED WITH A POSITION-SENSITIVE PROPORTIONAL COUNTER-Reference-Cited by-同舟云学术

CHEMICAL STATE ANALYSIS OF Cr AND Fe BY IN-AIR PIXE USING A CURVED CRYSTAL SPECTROMETER COMBINED WITH A POSITION-SENSITIVE PROPORTIONAL COUNTER

Published:2005-01 Issue:01n02 Volume:15 Page:1-9
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

MAEDA KUNIKO¹,HASEGAWA KENICHI²,HAMANAKA HIROMI³,OGIWARA KIYOSHI¹,TSUJI MASAMICHI⁴,MURAO SATOSHI⁵

Affiliation:

1. RIKEN (The Institute of Physical and Chemical Research), Wako-shi, 351-0198, Japan

2. MIS Ltd., 5-3-6, Yayoicho, Nakano-ku, 164-0013, Japan

3. Faculty of Engineering, Hosei University, Koganei-shi, 184-8584, Japan

4. E and E Solutions Inc., Asahi Bldg. 39-8-3 Kamata, Ota-ku, 155-0052, Japan

5. Institute for Geo-Resources and Environment, AIST, 1-1 Higashi, Tukuba-shi, 305-8567, Japan

Abstract

The feasibility of RIKEN high-resolution PIXE system for direct chemical state analysis of 3d transition elements was examined. K β spectra of Cr and Fe from several compounds were measured in air at atmospheric pressure using a crystal spectrometer consisting of a position-sensitive proportional counter and a curved crystal in v. Hamos geometry. Fine structures which reflect the chemical states of Cr and Fe were well recognized with the measuring time of tens minutes.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083505000246

Reference16 articles.

1. Development of an in-air high-resolution PIXE system

2. Chemical state analysis in air by high-resolution PIXE

3. Chemical shift measurements of PIXE spectra using a position-sensitive crystal spectrometer

4. IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE