Chemical shift measurements of PIXE spectra using a position-sensitive crystal spectrometer
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference10 articles.
1. Development of an in-air high-resolution PIXE system
2. Chemical state analysis in air by high-resolution PIXE
3. The X-Ray Emission Spectra of the Compounds of Third-period Elements. VI. The Relationship between theKα andKβ Spectra
4. Quantitative analysis of phosphorus in amorphous silicon using PIXE with a crystal spectrometer and PIPC
5. X-Ray Wavelengths
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2. Chemical speciation via X-ray emission spectroscopy in the tender X-ray range;Journal of Analytical Atomic Spectrometry;2016
3. Development of a WDX-μ-PIXE system for chemical state mapping;International Journal of PIXE;2014-01
4. Application of a wavelength-dispersive particle-induced X-ray emission system to chemical speciation of phosphorus and sulfur in lake sediment samples;Spectrochimica Acta Part B: Atomic Spectroscopy;2010-01
5. Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical state analysis of environmental samples;Review of Scientific Instruments;2007-07
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