IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE-Reference-Cited by-同舟云学术

IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE

Published:2001-01 Issue:01n02 Volume:11 Page:35-44
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

MAEDA KUNIKO¹,TONOMURA ATSURO²,HAMANAKA HIROMI²,HASEGAWA KENICHI²

Affiliation:

1. The Institute of Physical and Chemical Research (RIKEN), Wako-shi, Saitama 351-0198, Japan

2. Faculty of Engineering, Hosei University, Koganei-shi, 184-8584, Japan

Abstract

A narrow entrance slit was attached to an in-air high-resolution PIXE system composed of a flat analyzing crystal and a position-sensitive proportional counter. Chemical shift measurements were carried out for Si, P and S Kα1,2 lines from various sample targets. The precision of measurements is much improved compared with that obtained by the position-sensitive crystal spectrometer system without the entrance slit. The new system equipped with the entrance slit does not require exact sample positioning. It is applicable to non-flat targets. Chemical shift measurements are also possible while moving the targets.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083501000062

Reference10 articles.

1. HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS

2. Development of an in-air high-resolution PIXE system

3. Chemical state analysis in air by high-resolution PIXE

4. Chemical shift measurements of PIXE spectra using a position-sensitive crystal spectrometer

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rapid chemical state analysis in air by highly sensitive high-resolution PIXE using a v. Hamos crystal spectrometer;X-Ray Spectrometry;2005

2. CHEMICAL STATE ANALYSIS OF Cr AND Fe BY IN-AIR PIXE USING A CURVED CRYSTAL SPECTROMETER COMBINED WITH A POSITION-SENSITIVE PROPORTIONAL COUNTER;International Journal of PIXE;2005-01