HIGH RESOLUTION SOFT X-RAY SPECTROMETER FOR CHEMICAL STATE ANALYSIS BY PIXE-Reference-Cited by-同舟云学术

HIGH RESOLUTION SOFT X-RAY SPECTROMETER FOR CHEMICAL STATE ANALYSIS BY PIXE

Published:1992-01 Issue:01 Volume:02 Page:19-32
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

MAEDA K.¹,SASA Y.¹,UDA M.²

Affiliation:

1. The Institute of Physical and Chemical Research, Wako-shi, Saitama 351–01, Japan

2. Department of Materials Science and Engineering, Waseda University, 3–4–1 Ohkubo, Shinjuku-ku, Tokyo 169, Japan

Abstract

A soft X-ray crystal spectrometer designed for chemical state analysis by PIXE is described. A windowless, microchannel plate (MCP) electron multiplier combined with a photodiode array was used as a position-sensitive detector for X-rays diffracted by a plane crystal. The spectrometer was tested for Al Kα and Fe L X-ray spectra induced by 15 MeV N2+ ion impact. An energy resolution (FWHM) of 1.5 eV for the 1487 eV Al Kα1, 2 line was obtained for metallic Al, and satellite structures of Al Kα arising from multiply ionized states were well resolved. Fe L X-ray spectra were measured for Fe2O3 and metallic Fe. Chemical effects were clearly recognized in the Fe Lα/Lβ intensity ratio and in the intensity distributions of their multiple vacancy satellites.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083592000038

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1. WDX-PIXE analysis of low energy X-rays using a microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04

2. High-resolution PIXE instrumentation survey. Part II;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04

3. Development of an in-air high-resolution PIXE system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03

4. A MULTIANODE POSITION-SENSITIVE PROPORTIONAL COUNTER FOR IN-AIR HIGH-RESOLUTION PIXE USING A CRYSTAL SPECTROMETER;International Journal of PIXE;1998-01

5. GEOMETRICAL ABERRATIONS IN THE VON HAMOS AND THE PLANE BRAGG CRYSTAL SPECTROMETERS;International Journal of PIXE;1997-01