GEOMETRICAL ABERRATIONS IN THE VON HAMOS AND THE PLANE BRAGG CRYSTAL SPECTROMETERS-Reference-Cited by-同舟云学术

GEOMETRICAL ABERRATIONS IN THE VON HAMOS AND THE PLANE BRAGG CRYSTAL SPECTROMETERS

Published:1997-01 Issue:03n04 Volume:07 Page:117-133
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

Tadic T.¹,Mokuno Y.¹,Horino Y.¹,Jaksic M.²

Affiliation:

1. Osaka National Research Institute, 1-8-31 Midorigaoka, Ikeda, Osaka 563, Japan

2. "R. Boskovic" Institute, POB 1016, 10001 Zagreb, Croatia

Abstract

Numerical calculations of the effect of the finite dimensions and orientations of source and crystal are presented for plane and von Hamos Bragg crystal spectrometers for PIXE analysis, combined with a position sensitive (X-ray) detector. Analytical studies of all effects are provided. It is shown that some parameters can produce line shifts and asymmetries. A numerical model for an X-ray diffraction ray-tracing procedure for a crystal Bragg spectrometer is described.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083597000151

Reference8 articles.

1. Improvement of the energy resolution and the ratio of a crystal spectrometer combined with a position-sensitive proportional counter for PIXE

2. The energy resolution of a position sensitive spectrometer based on plane crystals

3. Geometrical aberrations in curved bragg crystal spectrometers

4. HIGH RESOLUTION SOFT X-RAY SPECTROMETER FOR CHEMICAL STATE ANALYSIS BY PIXE

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