Development of an in-air high-resolution PIXE system
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference21 articles.
1. PIXE analysis with external beams: Systems and applications
2. A compact flat-crystal X-ray spectrometer for external beam PIXE measurements
3. HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS
4. K. Maeda, K. Ogiwara, H. Hamanaka, K. Hasegawa, Report of Research Center of Ion Beam Technology, Hosei Univ., Suppl. 15, 1997, p. 103
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