PIXE analysis with external beams: Systems and applications-Reference-Cited by-同舟云学术

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PIXE analysis with external beams: Systems and applications

Published:1984-04 Issue:1-3 Volume:3 Page:211-219
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Williams Evan T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference94 articles.

1. Analytical application of particle induced X-ray emission

2. Proton Microprobes and Particle-Induced X-Ray Analytical Systems

3. Proton Induced X-Ray Emission Analysis: Part I

4. Proton-Induced X-Ray Emission Analysis

5. Proc. Third Conf. on Applications of Small Accelerators;Jolly,1974

Cited by 42 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Few MeV Laser-Plasma Accelerated Proton Beam in Air Collimated Using Compact Permanent Quadrupole Magnets;Applied Sciences;2021-07-09

2. Particle-Induced X-Ray Emission (PIXE);Encyclopedia of Analytical Chemistry;2016-12-21

3. Analysis of liquid materials in low vacuum with Wet-SIMS;Surface and Interface Analysis;2014-05-22

4. Measurement of proton beam fluence by PIXE analysis of residual gas;X-Ray Spectrometry;2012-02-09

5. A review of external microbeams for ion beam analyses;Analytical and Bioanalytical Chemistry;2011-04-17

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