USE OF HIGH-RESOLUTION X-RAY SPECTROMETER FOR THE STUDY OF CHEMICAL EFFECTS IN X-RAY SPECTRA-Reference-Cited by-同舟云学术

USE OF HIGH-RESOLUTION X-RAY SPECTROMETER FOR THE STUDY OF CHEMICAL EFFECTS IN X-RAY SPECTRA

Published:1996-01 Issue:01n02 Volume:06 Page:51-57
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

BUDNAR M.¹,KAVČIČ M.¹,TADIĆ T.²,BOGDANOVIĆ I.²,JAKŠIĆ M.²,DESNICA U.²

Affiliation:

1. J. Stefan Institute, Jamova 39, p.p. 3000, 1001 Ljubljana, Slovenia

2. R. Bošković Institute, Bijenička 54, p.p. 1016, 10000 Zagreb, Croatia

Abstract

In the contribution the high-resolution X-ray spectrometer, originally constructed for the atomic physics research, is presented. Test measurements of Lβ and Lγ intensity ratios on In and Te compounds were performed. The applicability of the spectrometer for detection of chemical effects in X-ray spectra of compounds is discussed.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083596000065

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