High-energy resolution μ-XRF analysis by position sensitive spectrometer
Author:
Publisher
Springer Science and Business Media LLC
Subject
Multidisciplinary
Link
http://link.springer.com/content/pdf/10.1007/BF02909681.pdf
Reference15 articles.
1. Maeda, K., Hasegawa, K., Hamanaka, H. et al., Development of an in-air high-resolution PIXE system, Nucl. Instr. & Meth., 1998, B134: 418.
2. Maeda, K., Hasegawa, K., Hamanaka, H. et al., Chemical state analysis in air by high-resolution PIXE, Nucl. Instr. & Meth., 1998, B136–138: 994.
3. Budnar, M., Kavcic, M., Tadic, T. et al., Use of high-resolution X-ray spectrometer for the study of chemical effects in X-ray spectra. Inter. J. of PIXE, 1996, 6 (1–2): 51.
4. Cindro, V., Budnat, M., Kregal, M. et al., Double K-shell vacancy production in Ca, Ti, V and Cr bombarded by protons, J. Phys. B: At. Mol. Opt. Phys., 1989, 22: 2161.
5. Kishimoto, S., Isozumi, Y., Ito, R. et al., A sample crystal spectrometer for low-energy X-rays emission form radio-active source, Appl. Radiat. Isot., 1989, 40(4): 229.
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