STUDY OF THE APPLICATION OF PSS AT SYNCHROTRON RADIATION-Reference-Cited by-同舟云学术

STUDY OF THE APPLICATION OF PSS AT SYNCHROTRON RADIATION

Published:2002-01 Issue:03n04 Volume:12 Page:93-99
ISSN:0129-0835
Container-title:International Journal of PIXE
language:en
Short-container-title:Int. J. PIXE

Author:

HU ZHAOHUI¹,LIU PINGSHENG¹,HUANG YUYING¹,WANG BAOYI¹,FENG GUOHUA¹,BUDNAR MILOŠ²,PELICON PRIMOŽ²,KAVČIČ MATJAŽ²

Affiliation:

1. Institute of High Energy Physics, Yuqian Lu 19, Beijing 100039, The People's Republic of China

2. J. Stefan Institute, Jamova 39, p.p. 3000, SI-1001 Ljubljana, Slovenia

Abstract

The paper presents the verification of home made Position Sensitive Spectrometer (PSS) while using synchrotron radiation light (SRL) as an excitation source. When Cr in the substance of light base was analyzed by the PSS, the lowest detection limit of a few ppm was achieved. Also linear proportionality between the count rate of the PSS and Cr concentration was obtained. This verities the feasibility of trace element analysis with high-energy resolution when using the PSS. At measurement of Cr Kβ5 band in metallic Cr and its compounds, it was discerned that the intensity of Cr Kβ5 becomes more intense with increasing oxidation number of Cr compounds. Such a change shows that high-energy resolution analysis using the PSS can make a useful method for the study of chemical states.

Publisher

World Scientific Pub Co Pte Lt

Link

https://www.worldscientific.com/doi/pdf/10.1142/S0129083502000184

Reference21 articles.

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2. X-ray MnKβemission spectra of manganese oxides and manganates

3. Molecular‐Orbital Interpretation of the Soft X‐RayLII,IIIEmission and Absorption Spectra from Some Titanium and Vanadium Compounds