Automatic Design and Yield Enhancement of Data Converters
Author:
Affiliation:
1. Lyle Department of Electrical Engineering, Southern Methodist University, Dallas, TX, USA
2. Electrical Engineering Department, K. N. Toosi University of Technology, Tehran, Mirdamad Biud No. 407, Iran
Abstract
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0218126617500189
Reference17 articles.
1. The Parametric Yield Enhancement of Integrated Circuits
2. Variability-Aware Parametric Yield Estimation for Analog/Mixed-Signal Circuits: Concepts, Algorithms, and Challenges
3. A 10-b 1-GHz 33-mW CMOS ADC
4. Device-Level Modeling and Synthesis of High-Performance Pipeline ADCs
5. Efficient and Accurate Statistical Analog Yield Optimization and Variation-Aware Circuit Sizing Based on Computational Intelligence Techniques
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1. A Class-AB Bulk-Driven Amplifier with Enhanced Transconductance Using Quasi-Floating Gate Method;Journal of Circuits, Systems and Computers;2018-04-26
2. A super class-AB adaptive biasing amplifier in 65-nm CMOS technology;International Journal of Electronics Letters;2017-09-11
3. Yield-aware sizing of pipeline ADC using a multiple-objective evolutionary algorithm;International Journal of Circuit Theory and Applications;2016-11-30
4. Resilient design of current steering DACs using a transistor level approach;Analog Integrated Circuits and Signal Processing;2016-09-15
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