Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/61/5/293/5854231/dfs050.pdf
Reference11 articles.
1. Surface voltage and surface photovoltage: history, theory and applications
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5. High accelerating voltage electron beam induced current (EBIC) of thick and thin solar silicon specimens
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1. Extraction of acceptor concentration map from EBIC experiments;Ultramicroscopy;2021-09
2. Electron beam induced current microscopy of silicon p–n junctions in a scanning transmission electron microscope;Journal of Applied Physics;2021-04
3. From EBIC images to qualitative minority carrier diffusion length maps;Ultramicroscopy;2019-02
4. Coatings for Energy Applications;Thin Film Structures in Energy Applications;2015
5. Plan View and Cross-Sectional View EBIC Measurements: Effect of e-Beam Injection Conditions on Extracted Minority Carrier Transport Properties;IEEE Transactions on Electron Devices;2014-07
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