Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map-Reference-Cited by-同舟云学术

Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map

Published:2017-12-15 Issue:suppl_1 Volume:67 Page:i142-i149
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:

Author:

Bekarevich Raman¹^ORCID,Mitsuishi Kazutaka¹²³,Ohnishi Tsuyoshi¹⁴⁵,Uesugi Fumihiko³^ORCID,Takeguchi Masaki³,Inaguma Yoshiyuki⁶,Ohno Takahisa¹⁴⁵,Takada Kazunori¹⁴⁵

Affiliation:

1. Global Research Center for Environment and Energy based on Nanomaterials Science (GREEN), National Institute for Materials Science, 1-1, Namiki, Tsukuba, Ibaraki305-0044, Japan

2. Research Center for Advanced Measurement and Characterization (RCAMC), National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki305-0047Japan

3. Transmission Electron Microscopy Station, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki305-0047Japan

4. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, 1-1, Namiki, Tsukuba, Ibaraki305-0044, Japan

5. Environment and Energy Materials Division, National Institute for Materials Science, 1-1, Namiki, Tsukuba, Ibaraki305-0044, Japan

6. Department of Chemistry, Faculty of Science, Gakushuin University, 1-5-1 Mejiro, Toshima-ku, Tokyo171-8588, Japan

Funder

Ministry of Education, Culture, Sports, Science and Technology (MEXT)

Publisher

Oxford University Press (OUP)

Subject

Radiology Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/67/suppl_1/i142/25107810/dfx121.pdf

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