UV-Raman Spectroscopy System for Local and Global Strain Measurements in Si-Reference-Cited by-同舟云学术

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UV-Raman Spectroscopy System for Local and Global Strain Measurements in Si

Published:2006-04-25 Issue:4B Volume:45 Page:3007-3011
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Ogura Atsushi,Yamasaki Kosuke,Kosemura Daisuke,Tanaka Satoshi,Chiba Ichiro,Shimidzu Ryosuke

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 101 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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