Information transfer of 25.5 nm−1in a 1-MV field-emission transmission electron microscope-Reference-Cited by-同舟云学术

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Information transfer of 25.5 nm−1in a 1-MV field-emission transmission electron microscope

Published:2016-03-23 Issue:4 Volume:65 Page:378-382
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Akashi Tetsuya,Takahashi Yoshio,Onai Toshio,Kasai Hiroto,Shinada Hiroyuki,Osakabe Nobuyuki,Tonomura Akira

Funder

Japan Society for the Promotion of Science

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/65/4/378/8037959/dfw009.pdf

Reference17 articles.

1. A spherical-aberration-corrected 200kV transmission electron microscope

2. Electron Holography Surmounts Resolution Limit of Electron Microscopy

3. Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy

4. Dynamic Observation of an Atom-Sized Gold Wire by Phase Electron Microscopy

5. Atomic resolution HVEM and environmental noise

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Simultaneous observation of multiple interferograms with Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope;Microscopy;2024-06-29

2. Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope;Microscopy;2020-07-15

3. Surface morphology and dislocation characteristics near the surface of 4H-SiC wafer using multi-directional scanning transmission electron microscopy;Journal of Electron Microscopy;2017-08-09

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