Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.69.3743/fulltext
Reference17 articles.
1. High-resolution Electron Microscopy of semiconductors and metals
2. Contrast transfer of crystal images in TEM
3. Electron Image Plane Off-axis Holography of Atomic Structures
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