Approaching Single Atom Resolution for Electron Beam Driven Transformations in Multilayer Crystals
Author:
Affiliation:
1. Department of Materials Science and Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts , USA
Publisher
Oxford University Press (OUP)
Link
https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.716/58640678/ozae044.716.pdf
Reference11 articles.
1. Silicon–Carbon Bond Inversions Driven by 60-keV Electrons in Graphene
2. Placing single atoms in graphene with a scanning transmission electron microscope
3. Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy
4. The Atomic Drill Bit: Precision Controlled Atomic Fabrication of 2D Materials
5. Genomic surveillance of SARS-CoV-2 Omicron variants on a university campus
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