Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy

Published:2022-10-07 Issue:10 Volume:16 Page:17116-17127
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Roccapriore Kevin M.¹^ORCID,Boebinger Matthew G.¹,Dyck Ondrej¹^ORCID,Ghosh Ayana²^ORCID,Unocic Raymond R.¹^ORCID,Kalinin Sergei V.³^ORCID,Ziatdinov Maxim¹²^ORCID

Affiliation:

1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States

2. Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee37831, United States

3. Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee37916, United States

Funder

Oak Ridge National Laboratory

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsnano.2c07451

Reference100 articles.

1. Imaging quantum materials

2. How the doors to the nanoworld were opened

3. Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts

4. Spontaneous Vortex Nanodomain Arrays at Ferroelectric Heterointerfaces

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