Visualizing Defects and Amorphous Materials in 3D with Mixed-State Multislice Electron Ptychography-Reference-Cited by-同舟云学术

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Visualizing Defects and Amorphous Materials in 3D with Mixed-State Multislice Electron Ptychography

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Karapetyan Shake¹,Zeltmann Steven²,Chen Ta-Kun³,Hou Vincent D H³,Muller David A¹

Affiliation:

1. School of Applied and Engineering Physics, Cornell University , Ithaca, NY , United States

2. Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University , Ithaca, NY , United States

3. Corporate Analytical Laboratories, Taiwan Semiconductor Manufacturing Company , Hsinchu , Taiwan

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.909/58670206/ozae044.909.pdf

Reference7 articles.

1. Depth sectioning of individual dopant atoms with aberration-corrected scanning transmission electron microscopy

2. The abTEM code: transmission electron microscopy from first principles

3. Electron ptychography achieves atomic-resolution limits set by lattice vibrations

4. Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy

5. High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy

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