Electron ptychography achieves atomic-resolution limits set by lattice vibrations

Author:

Chen Zhen1ORCID,Jiang Yi2ORCID,Shao Yu-Tsun1,Holtz Megan E.3ORCID,Odstrčil Michal4ORCID,Guizar-Sicairos Manuel4ORCID,Hanke Isabelle5,Ganschow Steffen5ORCID,Schlom Darrell G.356ORCID,Muller David A.16ORCID

Affiliation:

1. School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.

2. Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.

3. Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.

4. Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.

5. Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany.

6. Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.

Abstract

Locating atoms with higher precision Two major problems that limit the resolution and interpretation of electron microscopy images are lens aberrations and multiple scattering. Chen et al. overcame these issues with ptychography, a technique that uses coherent scattering and multiple overlapping illumination spots to reconstruct an image from far-field diffraction patterns. This method works at a resolution that is limited, not by optics, but rather by the scattering strength of the sample, so it can work better with thicker samples. The authors achieved ultimate lateral resolution better than the thermal vibration of atoms in a PrScO 3 sample and showed that it is theoretically possible to identify single dopant atoms. Science , abg2533, this issue p. 826

Funder

National Science Foundation

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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