Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors-Reference-Cited by-同舟云学术

Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors

Published:2017 Issue: Volume:129 Page:03019
ISSN:2261-236X
Container-title:MATEC Web of Conferences
language:
Short-container-title:MATEC Web Conf.

Author:

Makeev Mstislav,Meshkov Sergey,Sinyakin Vladimir

Publisher

EDP Sciences

Subject

General Medicine

Link

http://www.matec-conferences.org/10.1051/matecconf/201712903019/pdf

Reference16 articles.

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3. Mizuta H., Tanoue T., High-speed and functional applications of resonant tunnelling diodes. In The Physics and Applications of Resonant Tunnelling Diodes (Cambridge university press, 2006)

4. Fundamental oscillation of resonant tunneling diodes above 1 THz at room temperature

5. Fundamental Oscillation up to 1.31 THz in Resonant Tunneling Diodes with Thin Well and Barriers

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