Electrical Characteristics Temperature Dependence of 600V-Class Deep Implanted Gate Vertical JFET

Author:

Mizukami Makoto1,Takikawa Osamu1,Imai Seiji1,Kinoshita Kozo1,Hatakeyama Tetsuo1,Domon Tomokazu,Shinohe Takashi1

Affiliation:

1. Toshiba Corporation

Abstract

A 4H-SiC 600 V class Deep-Implanted gate Vertical JFET (DI-VJFET) is examined. The DI-VJFET exhibited a specific on-resistance of 13 mΩcm2, drain current of 5 A, and a blocking-voltage of 600 V. In this paper, the very high temperature dependence (R.T.~ 400 oC) of the I-V characteristics is measured and the dominant factor of the on-resistance and the blocking-voltage is discussed. Moreover, the switching waveform of SiC DI-VJFET with SiC SBD is measured by using a half bridge, double-pulse circuit with inductive load at R.T. and 200 oC. The turn-off time is 300 ns at an inductance of 4 mH and an external gate resistance of 100 Ω.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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