Affiliation:
1. FUPET
2. Matsushita Electric Industiral Co. Ltd.
Abstract
Large (3.6 x 3.6 mm2) chips of the SiC DACFET were fabricated and mounted in
TO220 packages. The drain-source avalanche breakdown voltage without any gate bias
(Vgs=0V) is measured to be >1400V. The SiC DACFET keeps the normally-off characteristics
even at 150°C. Ron and specific Ron of the SiC DACFET is measured to be 62mΩ and 6.7
mΩcm2 at RT while those at 150°C change to 107 mΩ and 11.6 mΩcm2. The 400V / 3 kW
DC-DC switched-mode power-conversion circuit with 100kHz switching was fabricated using
the SiC DACFET and the SiC SBD. The turn-off switching loss reduces dramatically using
the SiC-DACFET down to 77μJ/pulse which is less than 1/10 of that using the Si-IGBT.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献