Affiliation:
1. University of California
2. University of California, Berkeley
Abstract
In this work, a 4H-Silicon Carbide (SiC) Bipolar Junction Transistor (BJT) capable of operating at high temperatures up to 673 K is demonstrated. Comprehensive characterization including current gain, early voltage, and intrinsic voltage gain was performed. At elevated temperatures, although the current gain of the device is reduced, the intrinsic voltage gain increases to 5900 at 673 K, suggesting 4H-SiC BJT has the potential to be used as a voltage amplifier at extremely high temperatures.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference11 articles.
1. M.B.J. Wijesundara, and R.G. Azevedo, Silicon Carbide Microsystems for Harsh Environments, Springer, (2011).
2. D. G. Senesky, B. Jamshidi, K. B. Cheng, and A. P. Pisano, Harsh Environment Silicon Carbide Sensors for Health and Performance Monitoring of Aerospace Systems: a Review, IEEE Sensors Journal, vol. 9, no. 11, pp.1472-1478, (2009).
3. P.G. Neudeck, Progress in Silicon Carbide Semiconductor Electronics Technology, Journal of Electron Material, vol. 24, no. 4, pp.283-288, (1995).
4. P.G. Neudeck, R.S. Okojie, and L. -Y. Chen, High-Temperature Electronics – A Role for Wide Bandgap Semiconductors, Proceedings of the IEEE, vol. 90, no. 6, pp.1065-1076, (2002).
5. P. G. Neudeck, SiC Technology, in The VLSI Handbook, Second Edition, Florida: CRC Press, p.5. 1-5. 34, (2007).
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