15 kV, Large Area (1 cm2), 4H-SiC p-Type Gate Turn-Off Thyristors

Author:

Cheng Lin1,Agarwal Anant K.2,Capell Craig3,O'Loughlin Michael J.1,Lam Khiem1,Zhang Jon2,Richmond Jim1,Burk Al1,Palmour John W.1,Ogunniyi Aderinto4,O’Brien Heather4,Scozzie Charles4

Affiliation:

1. Cree, Incorporation

2. Cree, Inc.

3. Cree Incorporation

4. U.S. Army Research Laboratory

Abstract

In this paper, we report our recently developed 1 cm2, 15 kV SiC p-GTO with an extremely low differential on-resistance (RON,diff) of 4.08 mΩ•cm2 at a high injection-current density (JAK) of 600 ~ 710 A/cm2. The 15 kV SiC p-GTO was built on a 120 μm, 2×1014/cm3 doped p-type SiC drift layer with a device active area of 0.521 cm2. Forward conduction of the 15 kV SiC p-GTO was characterized at 20°C and 200°C. Over this temperature range, the RON,diff at JAK of 600 ~ 710 A/cm2 decreased from 4.08 mΩ•cm2 at 20°C to 3.45 mΩ•cm2 at JAK of 600 ~ 680 A/cm2 at 200°C. The gate to cathode blocking voltage (VGK) was measured using a customized high-voltage test set-up. The leakage current at a VGK of 15 kV were measured 0.25 µA and 0.41 µA at 20°C and 200°C respectively.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference5 articles.

1. M. S. Chinthavali, L. M. Tolbert, and B. Ozpineci, IEEE Industry Applications Society Annual Meeting (IAS 2004), Oct 3-7, 2004, Seattle, Washington.

2. A. Agarwal et al., Mat. Sci. forum Vol. 645-648 (2010), pp.1017-1020.

3. L. Cheng et al., Proceedings of International Conference on High Temperature Electronics (HiTEC 2012), Albuquerque, NM, USA, May 8-10, (2012).

4. T. Kimoto, et al., J. Appl. Phys., 108, 083721 (2010).

5. T. Hayashi et al., J. Appl. Phys., 109, 114502 (2011).

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