Bulk Passivation of Defects in Multi-Crystalline Silicon Solar Cells by a-SiNx:H Layers

Author:

Cornagliotti Emanuele1,Dekkers Harold F.W.1,Prastani Caterina1,John Joachim1,Van Kerschaver Emmanuel1,Poortmans Jef1,Mertens Robert P.2

Affiliation:

1. IMEC

2. Katholieke Universiteit Leuven

Abstract

In this work the impact of hydrogenation from hydrogen-rich amorphous silicon nitride (a-SiNx:H) on dislocations and grain boundaries in multi-crystalline silicon (mc-Si) solar cells is presented. Layers are deposited by means of plasma enhanced chemical vapor deposition (PECVD). Electrical bulk passivation is provided during thermal annealing, in which hydrogen diffuses from a-SiNx:H. The passivation effect is discussed in terms of recombination centers and non-recombinative charge traps reduction as well as in terms of local short circuit current improvement in specially manufactured solar cells.

Publisher

Trans Tech Publications, Ltd.

Subject

Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Minority carrier lifetime enhancement in multicrystalline silicon;The European Physical Journal Applied Physics;2012-01-05

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