Morphology and Structure of the Interface Layers in Ni/Ge Thin Films

Abstract

Morphology and structure of the interface in Ni/Ge thin films being due to the mutual diffusion of these elements are investigated with the help of atomic force microscope, high resolution electron microscope and micro-diffraction. Strong effect of interface in magnetic behavior of Ni layers is demonstrated and explained by formation of magnetic order in the interface and rough boundaries between layers.