6.5 kV n-Channel 4H-SiC IGBT with Low Switching Loss Achieved by Extremely Thin Drift Layer

Author:

Watanabe Naoki1,Yoshimoto Hiroyuki1,Shima Akio1,Yamada Renichi1,Shimamoto Yasuhiro1

Affiliation:

1. Research & Development Group, Hitachi, Ltd

Abstract

Thin drift layers were used to realize n-channel 4H-SiC IGBTs with an extremely low switching loss. The thickness of a drift layer was 60 μm, which was designed for a blocking voltage of 6.5 kV. An on-voltage of 5.4 V was obtained at a collector current of 100 A/cm2 and the specific differential on-resistance at 100 A/cm2 was 20 mΩcm2 at room temperature, indicating proper bipolar operation. A switching evaluation of the SiC IGBTs was performed with a bus voltage of 3.6 kV and a load current of 10 A, and a turn-off loss of 1.2 mJ was obtained. This turn-off loss is very small compared to the values in the current literatures, and was estimated to be an over 80% reduction. The series operation of thin-drift-layer 6.5 kV SiC IGBTs can ensure a lower switching loss than the single operation of higher blocking voltage devices in power conversion systems.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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