Affiliation:
1. University of Mining and Metallurgy
2. Technical University of Opole
Abstract
Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction of measurement time at the powder diffractometers by a factor up to 100 compared to instruments with a single counter, while maintaining comparable count statistics. Present work describes a 128-channel detector working with a standard diffractometer. The detector is 12.8 mm long and covers the angular range of 3.2 deg. We discuss the diffraction geometry in real and reciprocal space, the FWHM of diffraction peaks, and the
background level. Measurements were made on standard samples and on complex samples of industrial importance (e. g., portland clinker). Applications of the detector to diffraction measurements of single crystals and thin films are discussed briefly.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
2 articles.
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1. Application of a powder diffractometer equipped with a strip detector and Johansson monochromator to phase analysis and structure refinement;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2005-10
2. Silicon strip detector applied to X-ray diffractometer: Angular resolution and counting rate;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2005-10