Silicon strip detector applied to X-ray diffractometer: Angular resolution and counting rate-Reference-Cited by-同舟云学术

Silicon strip detector applied to X-ray diffractometer: Angular resolution and counting rate

Published:2005-10 Issue:1 Volume:551 Page:73-77
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Słowik Jacek,Zięba Andrzej

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

1. Position sensitive semiconductor strip detectors;Dąbrowski,2004

2. Applied Crystallography. Proceedings of the XVIII Conference;Zięba,2000

3. C.A. Reiss, M. Fransen, Book of Abstract of 20th European Crystallographic Meeting, Kraków, August 25–31 (2001) p. 260. This result is reproduced in booklets of Panalytical (former Philips Analytical) and in web: http://www.panalytical.com.

4. Prototype Silicon Position-Sensitive Detector Working with Bragg-Brentano Powder Diffractometer

5. 128-Channel Silicon Strip Detector Installed at a Powder Diffractometer

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