Application of a powder diffractometer equipped with a strip detector and Johansson monochromator to phase analysis and structure refinement

Author:

Paszkowicz Wojciech

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference55 articles.

1. U.W. Arndt, in: E. Prince (Ed.), International Tables for Crystallography, vol. C (Mathematical, Physical and Chemical Tables), third ed., Kluwer Academic Publishers, Dordrecht/Boston/London, 2004, pp. 623–635 (published for the International Union of Crystallography).

2. Detectors for X-ray diffraction and scattering: a user's overview

3. A novel application of silicon microstrip technology for energy-dispersive EXAFS studies

4. Synthesizing and fitting linear position-sensitive detector step-scanned line profiles

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