Affiliation:
1. United Silicon Carbide, Inc.
2. United Silicon Carbide
3. Rutgers University
Abstract
This paper reports a newly achieved best result on the common emitter current gain of
4H-SiC high power bipolar junction transistors (BJTs). A fabricated 1600 V – 15 A 4H-SiC power
BJT with an active area of 1.7 mm2 shows a high DC current gain (b) of 70, when it conducts 9.8 A
collector current at a base current of only 140 mA. The maximum AC current gain (DIC/DIB) is up to
78. This high performance BJT has an open base collector-to-emitter blocking voltage (VCEO) of over
1674 V with a leakage current of 1.6 μA, and a specific on-resistance (RSP-ON) of 5.1 mW.cm2 when it
conducts 7.0 A (412 A/cm2) at a forward voltage drop of VCE = 2.1 V. A large area 4H-SiC BJT with
a footprint of 4.1 mm x 4.1 mm has also shown a DC current gain over 50. These high-gain,
high-voltage and high-current 4H-SiC BJTs further support a promising future for 4H-SiC BJT
applications.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
12 articles.
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