Affiliation:
1. Hangzhou Dianzi University
2. Guangdong University of Technology
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference12 articles.
1. [1] A. Jas, et al.: “Weighted pseudo-random hybrid BIST,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 12 (2004) 1277 (DOI: 10.1109/TVLSI.2004.837985).
2. [2] S. Wang, et al.: “A low overhead high test compression technique using pattern clustering with N-detection test support,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 18 (2010) 1672 (DOI: 10.1109/TVLSI.2009.2026420).
3. [3] E. Kalligeros, et al.: “Reseeding-based test set embedding with reduced test sequences,” Proc. of Int’l Symp. Quality Electronic Design (2005) 226 (DOI: 10.1109/ISQED.2005.105).
4. [4] C. Hu, et al.: “BIST structure and test pattern generation method based on controlled LFSR,” Journal of Circuits and Systems 3 (2002) 13 (DOI: 10.3969/j.issn.1007-0249.2002.03.003).
5. [5] Z. You, et al.: “A scan disabling-based BAST scheme for test cost reduction,” IEICE Electron. Express 8 (2011) 1367 (DOI: 10.1587/elex.8.1367).
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