An online fault injection method for the dynamic partial reconfiguration system based on a lightweight ICAP controller-Reference-Cited by-同舟云学术

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An online fault injection method for the dynamic partial reconfiguration system based on a lightweight ICAP controller

Published:2018 Issue:19 Volume:15 Page:20180720-20180720
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Guohua Wang¹,Congsheng Tian¹,Dongming Luo¹

Affiliation:

1. School of Instrumentation Science & Opto-electronics Engineering, Beihang University

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/15/19/15_15.20180720/_pdf

Reference21 articles.

1. [1] P. S. Ostler, et al.: “SRAM FPGA reliability analysis for harsh radiation environments,” IEEE Trans. Nucl. Sci. 56 (2009) 3519 (DOI: 10.1109/TNS.2009.2033381).

2. [2] V. Chandra and R. Aitken: “Impact of technology and voltage scaling on the soft error susceptibility in nanoscale cmos,” Proc. of IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems (DFT) (2008) 114 (DOI: 10.1109/DFT.2008.50).

3. [3] N. N. Mahatme, et al.: “Comparison of combinational and sequential error rates for a deep submicron process,” IEEE Trans. Nucl. Sci. 58 (2011) 2719 (DOI: 10.1109/TNS.2011.2171993).

4. [4] M. Ebrahimi, et al.: “A fast, flexible, and easy-to-develop FPGA-based fault injection technique,” Microelectron. Reliab. 54 (2014) 1000 (DOI: 10.1016/j.microrel.2014.01.002).

5. [5] D. Radaelli, et al.: “Investigation of multi-bit upsets in a 150 nm technology SRAM device,” IEEE Trans. Nucl. Sci. 52 (2005) 2433 (DOI: 10.1109/TNS.2005.860675).

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