A fast, flexible, and easy-to-develop FPGA-based fault injection technique

Author:

Ebrahimi Mojtaba,Mohammadi Abbas,Ejlali Alireza,Miremadi Seyed Ghassem

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

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3. Ebrahimi M, Chen L, Asadi H, Tahoori MB. CLASS: combined logic and architectural soft error sensitivity analysis. In: Proceedings of 18th Asia and South Pacific design automation conference (ASP-DAC); 2013. p. 601–7.

4. Zhang B, Wang W, Orshansky M. FASER: fast analysis of soft error susceptibility for cell-based designs. In: Proceedings of the 7th international symposium on quality electronic design (ISQED); 2006. p. 755–60.

5. On the characterization and optimization of on-chip cache reliability against soft errors;Wang;IEEE Trans Comput (TC),2009

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