SRAM FPGA Reliability Analysis for Harsh Radiation Environments-Reference-Cited by-同舟云学术

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SRAM FPGA Reliability Analysis for Harsh Radiation Environments

Published:2009-12 Issue:6 Volume:56 Page:3519-3526
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Ostler Patrick S.,Caffrey Michael P.,Gibelyou Derrick S.,Graham Paul S.,Morgan Keith S.,Pratt Brian H.,Quinn Heather M.,Wirthlin Michael J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5341340/05341388.pdf?arnumber=5341388

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