Introduction to Latest RF ATE with Low Test Cost Solutions-Reference-Cited by-同舟云学术

Introduction to Latest RF ATE with Low Test Cost Solutions

Published:2012 Issue:7 Volume:E95.C Page:1147-1153
ISSN:0916-8524
Container-title:IEICE Transactions on Electronics
language:en
Short-container-title:IEICE Trans. Electron.

Author:

KIMISHIMA Masayuki¹

Affiliation:

1. Gunma Research and Development Center, Advantest Corporation

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/transele/E95.C/7/E95.C_1147/_pdf

Reference4 articles.

1. [1] R. Koller, T. Ruhlicke, D. Pimingsdorfer, and B. Adler, “A single-chip 0.13µSIPOS UMTS W-CDMA multi-band transceiver,” 2006 IEEE Radio Frequency Integrated Circuits Symposium, June 2006.

2. [4] A. Yoshimoto and T. Hattori, “Area coverage of a multi-link MIMO system with water filling power allocation strategy,” VTC-2007 Fall. 2007 IEEE 66th, pp.1137-1141, Sept. 30 2007-Oct. 3 2007.

3. [6] M. Kimishima, “Introduction to latest RF test technologies in RF ATE for low test cost,” 2011 China-Japan Joint Microwave Conference Proceedings, April 2011.

4. [7] Y.C. Lee, W.I. Chang, and C.S. Park, “Monolithic LTCC SiP transmitter for 60GHz wireless communication,” 2005 IEEE MTT-Symp. Digest, pp.1015-1018, 2005.

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