RF-SiP Technology of Reflect-meter for RF Testers
Author:
Affiliation:
1. ATE Unit Development Group, ADVANTEST CORPORATION
2. Graduate School of Engineering, Utsunomiya University
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering
Link
https://www.jstage.jst.go.jp/article/ieejeiss/133/3/133_450/_pdf
Reference24 articles.
1. (1) M. Kimishima, S. Mizuno, T. Seki, H. Takeuti, H. Nagami, H. Shirasu, Y. Haraguti, J. Okayasu, and M. Nakanishi : “A high density small size RF test module for high throughput multiple resource testing”, 2010 IEEE International Test Conference (2010-11)
2. (2) M. Kimishima : “Introduction to latest RF ATE with low test cost solutions”, IEICE Trans. Electron, Vol. E95-C, No. 7, pp. 1147-1153 (2012-7)
3. (3) J.-W. Lai, C.-H. Wu, A. Lin, W.-K. Hong, C.-Y. Wang, C.-H. Shen, Y.-H. Lin, Y.-H. Cho, Y.-C. Chen, and Y.-H. Chung : “A world-band triple-mode 802.11a/b/g SOC in 130-nSIPOS”, IEEE Journal of Solid-State Circuits, Vol. 44, No. 11, pp. 2911-2921 (2009-11)
4. (4) A. Mirzaei, H. Darabi, A. Yazdi, Z. Zhou, E. Chang, and P. Suri : “A 65 nm CMOS quad-band SAW-less receiver SoC for GSM/GPRS/EDGE”, IEEE Journal of Solid-State Circuits, Vol. 46, No. 4, pp. 950-964 (2011-4)
5. (5) http://www.sony.co.jp/Products/SC-HP/datasheet/33014/data/e6816788.pdf
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