A Body Bias Clustering Method for Low Test-Cost Post-Silicon Tuning
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Published:2012
Issue:12
Volume:E95.A
Page:2292-2300
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ISSN:0916-8508
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Container-title:IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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language:en
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Short-container-title:IEICE Trans. Fundamentals
Author:
KIMURA Shuta1, HASHIMOTO Masanori1, ONOYE Takao1
Affiliation:
1. Department of Information Systems Engineering, Osaka University
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Subject
Applied Mathematics,Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Signal Processing
Reference7 articles.
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