Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage-Reference-Cited by-同舟云学术

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Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

Published:2002-11 Issue:11 Volume:37 Page:1396-1402
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Tschanz J.W.,Kao J.T.,Narendra S.G.,Nair R.,Antoniadis D.A.,Chandrakasan A.P.,De V.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/22413/01046081.pdf?arnumber=1046081

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