Abstract
Abstract
Understanding the dissolution kinetics of resist materials is essential for their efficient development. In this study, we investigated the dissolution kinetics of poly(4-hydroxystyrene) (PHS) with a weight-average molecular weight (M
w) of 8000–30 000 and a polydispersity index (M
w
/M
n) of 1.07–1.20. The dissolution kinetics of PHS films was observed in tetramethylammonium hydroxide (TMAH) aqueous developers by a quartz crystal microbalance (QCM) method. The TMAH concentration was changed from 0 to 2.38 wt%. The formation of a thick transient swelling layer at these M
w
/M
n values was suppressed compared with that at M
w
/M
n > 2. QCM data were analyzed using the polynomial regression to clarify the effects of M
w and M
w
/M
n on the dissolution kinetics in a narrow polydispersity region. Both dissolving and swelling kinetics largely depended on M
w/M
n. M
w had little effect in 2.38 wt% TMAH developer; however, it had a large effect on the swelling when 2.38 wt% TMAH developer was diluted.
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
11 articles.
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