Abstract
Abstract
Recombination centers originating from point defects generated by the displacement of N atoms in n-type and p-type GaN were investigated by analyzing Shockley–Read–Hall (SRH) recombination currents in homoepitaxial GaN p–n junctions. These defects were intentionally generated by electron beam (EB) irradiation at 137 keV. The net doping concentrations in p+–n junction diodes were not changed following irradiation although the levels in p–n+ junction diodes decreased as the EB fluence was increased. The SRH recombination current also increased with increases in the fluence. This work additionally evaluated the relationship between recombination lifetimes and trap concentrations obtained by deep level transient spectroscopy.
Funder
Tatematsu Foundation
Ministry of Education, Culture, Sports, Science and Technology
Subject
General Physics and Astronomy,General Engineering