Effect of Atomic Force on the Surface Corrugation of 2H-NbSe2Observed by Scanning Tunneling Microscopy-Reference-Cited by-同舟云学术

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Effect of Atomic Force on the Surface Corrugation of 2H-NbSe2Observed by Scanning Tunneling Microscopy

Published:1987-01-20 Issue:Part 2, No. 1 Volume:26 Page:L41-L43
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Bando Hiroshi,Tokumoto Hiroshi,Mizutani Wataru,Watanabe Kazutoshi,Okano Makoto,Ono Masatoshi,Murakami Hiroshi,Okayama Shigeo,Ono Yuichi,Wakiyama Shigeru,Sakai Fumiki,Endo Kazuhiro,Kajimura Koji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A scanning tunneling microscope for a dilution refrigerator;Review of Scientific Instruments;2010-04

2. Atomic-Scale Processes of Tribomechanical Etching Studied by Atomic Force Microscopy on the Layered Material NbSe2;Fundamentals of Tribology and Bridging the Gap Between the Macro- and Micro/Nanoscales;2001

3. Transition in the growth kinetics of vacancy islands on NbSe2;Surface Science;1996-03

4. Discussion on Scanning Tunneling Microscopy Images with Resonant Tunneling Model;Japanese Journal of Applied Physics;1995-10-15

5. STM on Layered Materials;Springer Series in Surface Sciences;1994

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