1. Bando, H., Tokumoto, H., Mizutani, W., Watanabe, K., Okano, M., Ono, M., Murakami, H., Okayama, S., Ono, Y., Wakiyama, S., Sakai, F., Endo, K. and Kajimura, K. (1987), “ Effects of Atomic Force on the Surface Corrugation of 2H-NbSe2 Observed by Scanning Tunneling Microscopy”, Jpn. J. Appl. Phys.
26, L41–53.
2. Dahn, D.C., Watanabe, M. O., Blackford, B. L. and Jericho, M. H. (1988), “Tunneling Microscopy of 2H-NbSe2 in Air”, J. Appl Phys.
63, 315–322.
3. Gavarri, J. R., Mokrani, R., Vacquier, G. and Boulesteix, (1989), “Relations Between Anisotropic Defects Structural Evolution and van der Waals Bonding in 2H-NbSe2” Phys. Stat Sol.
10a, 445–449.
4. Lux-Steiner, M. Ch. (1991), Synthesis, Optoelectronic Properties and Applications of new Semicondictor Crystals, Springer Verlag, Heidelberg, Germany.
5. Parkinson, B. (1990), “Layer-by-Layer Nanometer Scale Etching of Two-Dimensional Substrates Using the STM”, J. Am. Chem. Soc.
112, 7498–7502.