Investigation of Surface Passivation Effect of $\bf a\mbox{-}SiN_{\ninmbi x}:H$ on a-Si:H by Photothermal Deflection Spectroscopy-Reference-Cited by-同舟云学术

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Investigation of Surface Passivation Effect of $\bf a\mbox{-}SiN_{\ninmbi x}:H$ on a-Si:H by Photothermal Deflection Spectroscopy

Published:1994-06-15 Issue:Part 2, No. 6B Volume:33 Page:L873-L875
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Umezu Ikurou,Daigo Michio,Maeda Keiji

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photoluminescence properties of amorphous silicon-based oxygen and hydrogen alloys;Journal of Applied Physics;2002-02-15

2. Correlation between Photoluminescence Intensity and Micro Structure in Amorphous Silicon Films Prepared by Reactive RF Sputtering;Japanese Journal of Applied Physics;2000-08-15

3. Structure, optical absorption and electronic states of Zn+ ion implanted and subsequently annealed sol–gel anatase TiO2 films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-06

4. Optical properties of single-wall carbon nanotubes;Synthetic Metals;1999-06

5. Effect of plasma treatment on the density of defects at an amorphous Si:H-insulator interface;Journal of Applied Physics;1998-08

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