Tungsten Oxide Resistive Memory Using Rapid Thermal Oxidation of Tungsten Plugs-Reference-Cited by-同舟云学术

Tungsten Oxide Resistive Memory Using Rapid Thermal Oxidation of Tungsten Plugs

Published:2010-04-20 Issue:4 Volume:49 Page:04DD17
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Lai Erh-Kun,Chien Wei-Chih,Chen Yi-Chou,Hong Tian-Jue,Lin Yu-Yu,Chang Kuo-Pin,Yao Yeong-Der,Lin Pang,Horng Sheng-Fu,Gong Jeng,Tsai Shih-Chang,Lee Ching-Hsiung,Hsieh Sheng-Hui,Chen Chun-Fu,Shih Yen-Hao,Hsieh Kuang-Yeu,Liu Rich,Lu Chih-Yuan

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference6 articles.

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5. Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films

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