Measurements of Minute Lattice Distortions in Silicon Crystals by X-Ray Double-Crystal Topography Using Extremely Asymmetric Reflection-Reference-Cited by-同舟云学术

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Measurements of Minute Lattice Distortions in Silicon Crystals by X-Ray Double-Crystal Topography Using Extremely Asymmetric Reflection

Published:2004-12-09 Issue:12 Volume:43 Page:8331-8334
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Fukumori Taichiro,Futagami Koji,Kuroki Kiyohiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/43/i=12R/a=8331/pdf

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metal-organic framework-derived bird's nest-like capsules for phosphorous small molecules towards flame retardant polyurea composites;Journal of Colloid and Interface Science;2023-08

2. Influence of asymmetrical angle on crystal lattice strain analysis using Voigt-function method;Acta Physica Sinica;2018

3. Observations of Lattice Distortions near Silicon Surfaces Implanted with Low-Energy Nitrogen Ions by Reflection X-ray Topography;Japanese Journal of Applied Physics;2005-08-05

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