A Kinetic Model of Silicon Carbide Oxidation Based on the Interfacial Silicon and Carbon Emission Phenomenon
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
http://stacks.iop.org/1882-0786/2/i=2/a=021203/pdf
Reference15 articles.
1. Intrinsic SiC/SiO2 Interface States
2. Real Time Observation of SiC Oxidation Using an In Situ Ellipsometer
3. Growth Rate Enhancement of (000\bar1)-Face Silicon–Carbide Oxidation in Thin Oxide Regime
4. Oxide Growth Rate Enhancement of Silicon Carbide (0001) Si-Faces in Thin Oxide Regime
Cited by 88 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Modeling passive/active transition in high-temperature dry oxidation of reaction-sintered SiC for innovative fuel matrix in high-temperature gas-cooled reactors;Journal of the European Ceramic Society;2024-05
2. Defect Profiling of Oxide‐Semiconductor Interfaces Using Low‐Energy Muons;Advanced Materials Interfaces;2023-06-23
3. Research on Interface Properties of Thermally Grown SiO2 and ALD SiO2 Stacked Structures;ECS Journal of Solid State Science and Technology;2023-05-01
4. Oxidation behavior of SiC nanowires: A nanowire radius‐dependent growth of oxide scale thickness;Journal of the American Ceramic Society;2022-09-08
5. Model for elimination of lifetime-limiting carbon vacancy defects in SiC by thermal treatment;Journal of Applied Physics;2022-07-21
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3