Publisher
The Electrochemical Society
Subject
Electronic, Optical and Magnetic Materials
Reference76 articles.
1. Watkins G. D. , in Deep Centers in Semiconductors (Gordon and Breach Science Publishers, New York, 1986), edited by Pantelides S. T. .
2. Brother Silicon, Sister Germanium
3. Schroder D. K. , Semiconductor material and device characterization (John Wiley & sons, Inc., New York, 1998), 2nd ed.
4. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
5. Defect identification in semiconductors with positron annihilation: Experiment and theory
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