The Effect of 2-hydroxyphosphonoacetic Acid on the Removal Rate Selectivity of Cu/Co/TEOS in H2O2 Based Alkaline Slurries

Author:

Liu Jia,Hu Lianjun,Liu Yuling,Zhu Tiantian,Wang Ziyan,Pan GuofengORCID

Abstract

As the technology node shrinks to 14 nm, Co has been widely used as a liner in semiconductor devices. However, the dishing and erosion produced after fine polishing seriously affect the RC delay of the device, so achieving a reasonable Cu/Co/TEOS removal rate (RR) selectivity is the key to correct the dishing and erosion. In this paper, the effect of 2-hydroxyphosphonoacetic Acid (HPAA) as a complexing agent on Cu/Co/TEOS RR selectivity in H2O2 based alkaline slurries was well investigated. In addition, the complexation mechanism between Co and HPAA was analyzed through electrochemical experiments, UV/vis, XPS tests, etc. The results showed that the RRs of Cu/Co/TEOS in the optimized slurry containing 5 wt% SiO2, 0.15 wt% H2O2, 0.05 wt% HPAA, 500 ppm TT-LYK at pH = 10 are ∼ 163 Å min−1, ∼ 350 Å min−1, ∼ 374 Å min−1, respectively. The RR selectivity of Co to Cu (VCo/VCu) and TEOS to Cu (VTEOS/VCu) were ∼ 2.15 and ∼ 2.3. At this time, the surface quality of the polished wafer was good, the dishing was corrected by ∼ 910 Å, and the erosion was corrected by ∼ 1117 Å.

Funder

the National Natural Science Foundation of Hebei province

Major National Science and Technology Special Projects

the Key Project of Natural Science of Hebei Province Colleges and Universities

Publisher

The Electrochemical Society

Subject

Electronic, Optical and Magnetic Materials

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3